The company says that "the 4680 in-house cell project" at the Kato pilot facility in California "continues to progress." For reference, three months ago the company said that there was substantial ...
The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
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